A new computational framework maps 3D atomic positions in amorphous materials, achieving full accuracy for silica using ...
Support grids are a key part of electron microscopy measurements; the choice of the grid can directly influence the quality and accuracy of the final image. This is particularly true for transmission ...
Using a STEM-in-SEM conversion holder, we can convert a scanning electron microscope into a scanning transmission microscope. Neat!
Electron microscopy combined with X-ray microanalysis represents a pivotal suite of techniques that have transformed research in materials science, physics and engineering. Utilizing focused beams of ...
In this interview, AZoMaterials speaks with Professor Sarah Haigh, Professor of Materials Characterization at the University of Manchester, about her pioneering work in electron microscopy and its ...
Electron microscopy has become a vital tool in structural biology, enabling researchers to visualize biological macromolecules at near-atomic resolution. Recent advances have transformed it from a low ...
The FEI 200kV Titan Themis Scanning Transmission Electron Microscope (STEM) is a scanning transmission electron microscope with several key capabilities. This microscope positions Michigan Tech ...
In transmission electron microscopy (TEM), where the electron beam passes through the sample to be directly imaged on the detector below, it is often necessary to support the thin samples on a grid.
Early diagnosis and noninvasive monitoring of neurological disorders require sensitivity to elusive cellular-level ...