Inovys Corp. announced it has contracted Q-star Test of Belgium to develop advanced IDDQ test capabilities for its latest design-for-test (DFT) test system. Q-star will provide advanced ...

LSI Logic’s new Iddalyzer automated design-for-test (DFT) methodology for ASICs complements existing chip-test methodologies, such as scan or built-in self-test. The methodology thus lets you increase ...

To improve yield, quality, and cost, two separate test parameters can be combined to determine if a part passes or fails. The results gleaned from that approach are more accurate, allowing test and ...