The technology aims for significant reduction of microchip’s layout design cycle; particularly, in advanced nanometer ranges, 7nm and below, enabling faster chip’s design and manufacturing cycle SAN ...

As technology migrates from 90 nm to 65 nm and, eventually, to the 45-nm node, fast yield ramp-up is increasingly difficult to achieve due to the sub-wavelength effects of lithography. While minimum ...

Physical verification is an essential step in integrated circuit (IC) design verification. Foundries provide design rule manuals that specify the precise physical requirements needed to ensure the ...

In VLSI layout design, density issues are critical factors influencing the performance, yield, and reliability of integrated circuits. This whitepaper delves into the several types of density issues, ...

Process design kits consist of a set of files that typically contain descriptions of the basic building blocks of the process. They are expressed, algorithmically, as Pcells. These descriptions are ...