The variety of different test methodologies combined with today�s mixture of memory devices creates a complex test profile. The manufacturing test floor hums with activity; a range of memory devices ...

Having explained in part 1 the nature of the memory test challenge in the industry today, this article discusses non-intrusive debug and test methods based on embedded instruments and how these ...

Data retention is a funny thing. Atmel will gladly tell you that the flash memory in an ATmega32A will retain its data for 100 years at room temperature. Microchip says its EEPROMs will retain data ...