Modern radio frequency (RF) components introduce many challenges to outsourced semiconductor assembly and test (OSAT) suppliers whose objective is to ensure products are assembled and tested to meet ...

Developing an automated production test solution for current and next-generation complex RF SIP/SOC devices is an increasingly difficult task. Both the test program and the device interface board (DIB ...

Collaborations between colleges and electronics companies are growing to meet fast-changing engineering needs. In the latest collaboration, semiconductor test equipment supplier Advantest Corporation ...

With high measurement speed and stability, the R&S ZNB3000 vector network analyzer (VNA) supports large-scale RF component production. Its PCB-based frontend minimizes thermal drift, enabling reliable ...

The differences between conducted and over-the-air (OTA) testing. The hardware building blocks of a conducted RF test environment. The measurements to keep in mind when it comes to verification. From ...

http://www.maxwell.comSystem reliability concerns are imperative to the implementation of today's broadband wireless infrastructure. Wireless networks require new ...

A rapid increase in wireless connectivity and more sensors, coupled with a shift away from monolithic SoCs toward heterogeneous integration, is driving up the amount of analog/RF content in systems ...

SANTA ANA, Calif., Feb. 16, 2023 (GLOBE NEWSWIRE) -- TTM Technologies, Inc. (NASDAQ: TTMI) ("TTM"), a leading global manufacturer of technology solutions including engineered systems, radio frequency ...