A high-frequency center-probe test socket features a floating guide plate with a built-in hand stop to protect probes during test and eliminate damage to the package leads. Well suited for automated ...
The continuing advances in semiconductor functionality, density, and chip-level integration are generating new challenges in accessing devices for test and controlling the physical and electrical ...
一些您可能无法访问的结果已被隐去。
显示无法访问的结果