Researchers developed a method to enhance 3D imaging of lithium-ion battery electrodes, improving visualization of internal ...

A new technical paper titled “Scanning electron microscopy-based automatic defect inspection for semiconductor manufacturing: a systematic review” was published by researchers at KU Leuven and imec.

Environmental Scanning Electron Microscopy (ESEM) represents a significant evolution of conventional scanning electron microscopy. By utilising variable pressure conditions rather than the high vacuum ...

TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announced that it has developed semi-in-lens versions (i)/(is) which are optimal for the observation of semiconductor devices ...

Unlike optical microscopy, SEM does not rely on light waves but instead uses a beam of electrons to interact with materials, enabling magnifications up to 300,000× and resolutions approaching 1 nm. 1 ...

In this study, COXEM Co., Ltd. analyzed cosmetic samples using Scanning Electron Microscopy (SEM) to investigate their surface morphology and compositional characteristics. The high-resolution imaging ...

Who wouldn’t want to have a scanning electron microscope (SEM)? If you’re the person behind the ProjectsInFlight channel on YouTube, you certainly do. In a recent video it’s explained how he got his ...

If you want to build semiconductors at home, it seems like the best place to start might be to find a used scanning electron microscope on eBay. At least that’s how [Peter Bosch] kicked off his ...

A unique laboratory at Michigan Tech captured microscopic photography of snowflakes in a demonstration of the lab's high-powered scanning electron microscope. The Applied Chemical and Morphological ...