The special Collection “Machine learning for automated experimentation in STEM” explores all aspects of the integration of machine learning (ML) into STEM to transform experimental workflows. This ...

With the demand for high-performnce materials increasing, it has become necessary to optimize their structural properties at the nanoscale, underscoring the importance of systematic and routine ...

A comparison of experimental annular dark field (ADF)-scanning transmission electron microscopy (STEM) and electron ptychography in uncorrected and aberration-corrected electron microscopes. In the ...

The FEI 200kV Titan Themis Scanning Transmission Electron Microscope (STEM) is a scanning transmission electron microscope with several key capabilities. This microscope positions Michigan Tech ...

Responsive technique: Jonathan Peters using an electron microscope at Trinity College Dublin (Courtesy: Lewys Jones and Jonathan Peters/Trinity College Dublin) A new scanning transmission electron ...

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A new technical paper titled “Interface sharpness in stacked thin film structures: a comparison of soft X-ray reflectometry and transmission electron microscopy” was published by researchers at ...