Agilent Technologies has announced a strategic partnership with Aster Technologies to enable integration of Aster's TestWay Coverage Analyst with Agilent's printed-circuit-board assembly-test ...

While the analog and mixed-signal components are the leading source of test escapes that result in field failures, the lack of tools to analyze the test coverage during design has made it difficult ...

The complexity of system-on-chip (SoC) designs continues to grow, so the corresponding design-for-test (DFT) logic required for manufacturing has become more advanced. Design teams are challenged by ...

Scan is a structured test approach in which the overall function of an integrated circuit (IC) is broken into smaller structures and tested individually. Every state element (D flip-flop or latch) is ...

How exhaustive static analysis overcomes the limitations of traditional tests and static-analysis tools. How exhaustive static analysis identifies a buffer overflow by using code samples. How hardware ...