Samsung Electronics Co. Ltd. has successfully completed its evaluation of KLA-Tencor Corp.'s 2350 ultraviolet (UV) high-resolution imaging wafer inspection tool for use in monitoring the production of ...

Samsung Electronics Co. Ltd. has successfully completed its evaluation of KLA-Tencor Corp.'s 2350 ultraviolet (UV) high-resolution imaging wafer-inspection tool for use in monitoring the production of ...

Unpatterned wafer inspection, which has flown well under the radar for most of the semiconductor industry, is becoming more critical amid the need to find defects earlier in the manufacturing process ...

Defect inspection scientists from Huazhong University of Science and Technology, Harbin Institute of Technology and The Chinese University of Hong Kong make a thorough review of new perspectives and ...

Microtronic, maker of advanced macro defect inspection systems and software, has announced a convenient and highly precise way to monitor the weights of semiconductor wafers at the same time as ...