Abstract: In modern Very-Large-Scale Integration (VLSI) technology, managing information loss is a critical challenge. Conventional logic gates, such as AND, OR, and NOT, are prone to data loss during ...

Design careers, these days, sit at the intersection of creativity, technology, and fabrication. Industrial designers ...

Abstract: In this work, the design of Vertical FET (VFET) for logic applications is comprehensively studied by the DTCO (Design Technology Co-Optimization) methodology. The nanosheet channel placement ...