First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...

International Research Centre for Nano Handing and Manufacturing of China, Changchun University of Science and Technology, Changchun 130022, China Zhongshan Institute of Changchun University of ...

Kelvin probe force microscopy (KPFM) is a technique derived from atomic force microscopy that provides maps of surface potential or work function differences across material systems, with ...

Today we're looking at Atomic Force Microscopy! I built a "macro-AFM" to demonstrate the principles of an atomic force microscope, then we look at a real AFM (an nGauge AFM from ICSPI) and do a few ...

Today we're looking at Atomic Force Microscopy! I built a "macro-AFM" to demonstrate the principles of an atomic force microscope, then we look at a real AFM (an nGauge AFM from ICSPI) and do a few ...

Reaching nanometric spatial resolution in terahertz (THz) nanoimaging provides a powerful tool for the characterization of photonic devices. Here, we couple a THz source to a conductive atomic force ...

Scientists at the Department of Energy's Oak Ridge National Laboratory have reimagined the capabilities of atomic force microscopy, or AFM, transforming it from a tool for imaging nanoscale features ...

The adhesion properties between warm-mix recycled asphalt and aggregates are a key bottleneck limiting the application of warm-mix recycled asphalt. To investigate the effects of aging, warm mix agent ...

Scientists have built a microscope capable of visualizing optical responses at the scale of individual atoms, redefining the limits of optical imaging. Scientists have created a groundbreaking ...