Abstract: The semiconductor industry plays a vital role in modern technology, with semiconductor devices embedded in almost all electronic products. As these devices become increasingly complex, ...

Abstract: Minimizing the testing cost is crucial in the context of the design for test (DFT) flow. In our observation, the test patterns generated by commercial ATPG tools in test compression mode ...

According to @godofprompt, Anthropic's latest research demonstrates that increased computation time during inference, known as 'Inverse Scaling in Test-Time Compute,' can actually degrade the accuracy ...