Abstract: This work introduces a novel accelerated lifetime testing (ALT) methodology for Lateral GaN-on-Si high electron mobility transistors (HEMTs) called “Three Factor Acceleration Testing.” By ...
With the updated tool-free design, it is easier than ever to upgrade and maintain your ASUS ExpertCenter small form factor PC. Follow the instructions in the video carefully to learn how to easily ...
Abstract: This article derives and validates a set of distance conversion factors for the magnetic field emissions limits in the frequency range from 9 kHz to 30 MHz, which are intended to be proposed ...
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