IEEE

Performance and Compact Modeling of Transistors for Wide Temperature Range Electronics

Abstract: This paper presents experimental performance characterization and compact modeling of transistors with circuit application for wide temperature range operation electronics used in space ...
IEEE

Physics-Constrained Neural Network-Based Compact Modeling of Displacement Damage for AlGaN ...

Abstract: This article proposes a physics-constrained neural network (PCNN) framework to model displacement damage-induced degradation in AlGaN/GaN high-electron-mobility transistors (HEMTs). The ...