New NASA-level software framework reproduces DUT vs ΛCDM results, resolving Hubble and growth tensions with Δχ² = ...

PCA and K-means clustering applied to Raman and PL imaging reveal structural defects in silicon wafers, enhancing understanding of optoelectronic performance.

Abstract: In underwater subsea environments light attenuation, water turbidity, and limitations of the optical devices make the captured images suffer from poor contrast and quality, proportional ...